The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2009

Filed:

Sep. 11, 2006
Applicants:

Eberhard Fischer, Röttenbach, DE;

Rainer Meier, Erlangen, DE;

Friedrich Mohr, Nürnberg, DE;

Inventors:

Eberhard Fischer, Röttenbach, DE;

Rainer Meier, Erlangen, DE;

Friedrich Mohr, Nürnberg, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/26 (2006.01); G01N 29/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a device for the ultrasonic testing of a workpiece having an uneven surface is provided. An ultrasonic test head containing a multiplicity of transducer elements arranged rigidly in a linear array, is acoustically coupled to a workpiece. The ultrasonic test head can be driven in a time-delayed manner with a delay time predetermined for each transducer element. The propagation time of an ultrasonic signal transmitted by an individual transducer element and reflected from the surface and received by this transducer element is measured for a number of the transducer elements and is used for correcting the delay times. The transducer elements are subsequently driven with these corrected delay times.


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