The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2009
Filed:
Sep. 22, 2003
Oscar V. Zhuk, Bellevue, WA (US);
Vince M. Rohr, Woodinville, WA (US);
Oscar V. Zhuk, Bellevue, WA (US);
Vince M. Rohr, Woodinville, WA (US);
Widevine Technologies, Inc., Seattle, WA (US);
Abstract
A method and system are directed to differentiating between normal characteristics and abnormal characteristics within a software process, such that tampering of the software process may be identified programmatically. The identification of behavior that may be defined as normal may vary. Such behavior may include a sequence of selected system level calls that may access resources considered relevant, and the like. Data on the selected behavior is gathered, and when a sufficient amount of abnormal behavior has been detected, a signal may be provided such that an action may be performed. Samples of the gathered data are assigned a unique value. Statistical information is determined from the collected behavior, including trend data. Such trend data is compared to trends identified as normal for the software process, and a determination is made whether the sampled behavior is non-normal.