The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2009

Filed:

Jan. 24, 2007
Applicants:

Paul DE Dood, Pleasanton, CA (US);

Brian Lee, Santa Clara, CA (US);

Daniel Albers, Beaver, PA (US);

Inventors:

Paul de Dood, Pleasanton, CA (US);

Brian Lee, Santa Clara, CA (US);

Daniel Albers, Beaver, PA (US);

Assignee:

Prolific, Inc., Newark, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method for parallel optimization of an integrated circuit design based on the use of sets of cell instances that are independent from each other. Multiple changes to a design are analyzed in parallel by ensuring that no two cell instances that are being changed are in the same fan-in and fan-out cones. This property allows full timing analysis to be performed on a design such that multiple alternatives are explored in parallel and accurate results are obtained. By ordering the choice of cell instances to change and by ordering the alternatives to try, a greater degree of optimization is found earlier in the process.


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