The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2009
Filed:
Aug. 14, 2007
Gareth David Edwards, Edinburgh, GB;
David Finlay Taylor, Edinburgh, GB;
Duncan Andrew Cockburn, Edinburgh, GB;
Douglas Michael Grant, Gorebridge, GB;
Stuart Alan Nisbet, Edinburgh, GB;
Gareth David Edwards, Edinburgh, GB;
David Finlay Taylor, Edinburgh, GB;
Duncan Andrew Cockburn, Edinburgh, GB;
Douglas Michael Grant, Gorebridge, GB;
Stuart Alan Nisbet, Edinburgh, GB;
Xilinx, Inc., San Jose, CA (US);
Abstract
Measuring transit time across an asynchronous first-in-first-out (FIFO) memory can include sampling an indication of a value of a read pointer of the FIFO memory at a sampling frequency that exceeds a frequency of a read clock and a write clock of the FIFO memory. An indication of a value of a write pointer of the FIFO memory can be sampled at the sampling frequency. For each sampling period, a measure of occupancy of the FIFO memory can be calculated according to a sampled pair including the indication of the value of the read pointer and the indication of the value of the write pointer. The measure of occupancy can be averaged over a predetermined number of cycles of the sampling frequency. The averaged measure of occupancy can be output as an indication of transit time across the FIFO memory.