The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2009

Filed:

Mar. 30, 2006
Applicants:

Alfred Robert Zantow, Elgin, IL (US);

Ray Prado, Chicago, IL (US);

Randy Olenz, Naperville, IL (US);

Kurt Hedlund, Oak Park, IL (US);

Steve Sanders, Hinckley, IL (US);

Inventors:

Alfred Robert Zantow, Elgin, IL (US);

Ray Prado, Chicago, IL (US);

Randy Olenz, Naperville, IL (US);

Kurt Hedlund, Oak Park, IL (US);

Steve Sanders, Hinckley, IL (US);

Assignee:

ARRIS Group, Inc., Suwanee, GA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The offset between a reference clock output signal and a target clock output signal are measured during a predetermined period. Based on the measurement, an offset signal is generated. The offset signal is integrated into an average offset signal value, wherein the period of integration is the predetermined phase measurement time. The target clock is adjusted based on the average offset signal value so that the offset signal magnitude value approaches a predetermined limit. The process is iterated until the clocks are aligned within a predetermined tolerance.


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