The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2009
Filed:
May. 26, 2006
Grenville Arthur Robinson, Rosemarkie, GB;
John Mcinulty, Westhill, GB;
Damian Edward Haydon Baskeyfield, Auldeam, GB;
Thomas J. O'reilly, Invemess, GB;
Anthony J. Cronshaw, Cambridge, GB;
Grenville Arthur Robinson, Rosemarkie, GB;
John McInulty, Westhill, GB;
Damian Edward Haydon Baskeyfield, Auldeam, GB;
Thomas J. O'Reilly, Invemess, GB;
Anthony J. Cronshaw, Cambridge, GB;
Lifescan Scotland Limited, , GB;
Abstract
A method for determining a test strip calibration code for use in a meter includes inserting a test strip into the meter. The inserted test strip having a substrate with a working surface for receiving the body fluid sample and a reverse surface that is in opposition to the working surface. The test strip also includes a permutative grey scale calibration pattern disposed on either of the working and reverse surfaces, with the permutative grey scale calibration pattern including more than one grey scale region. Moreover, the scale regions of the test strip define a grey scale permutation that uniquely corresponds to a calibration code of the test strip. The method also includes detecting the permutative grey scale calibration pattern with a grey scale photodetector module of the meter and determining a calibration code that uniquely corresponds to a grey scale permutation defined by the permutative grey scale calibration pattern based on permutation matrix stored in the meter.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile