The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2009

Filed:

Sep. 26, 2007
Applicants:

Shen-luan Liu, Taipei, TW;

Che-fu Liang, Taipei, TW;

Hsin-hua Chen, Taipei, TW;

Inventors:

Shen-luan Liu, Taipei, TW;

Che-Fu Liang, Taipei, TW;

Hsin-Hua Chen, Taipei, TW;

Assignee:

Mediatek Inc., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A phase frequency detector with two different delays is disclosed herein. The phase detector comprises a first D flip-flop, a second D flip-flop, a first delay unit and a second delay unit. The first D flip-flop receives a reference signal to output an up signal. The second D flip-flop receives a clock signal to output a down signal. The first delay unit delays the received signal with a first delay. The second delay unit delays the received signal with a second delay. When the reference signal synchronizes with the clock signal and the charge pump currents are calibrated, the high-level pulse widths of the up signal and the down signal are determined based on the first delay, and when the reference signal does not synchronize with the clock signal and the charge pump currents are not calibrated, the high-level pulse widths of the up signal and the down signal are determined based on the second delay.


Find Patent Forward Citations

Loading…