The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2009

Filed:

Mar. 10, 2005
Applicant:

Takashi Gouke, Higashine, JP;

Inventor:

Takashi Gouke, Higashine, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

A magnetic recording medium is disclosed that is able to increase a coercive force Hc of a recording layer and improve a signal-to-noise ratio of the recording layer without degradation of a thermal fluctuation resistance of the recording layer, and enables high density recording. The magnetic recording medium includes a substrate, a seed layer formed from a crystalline material, a grain diameter control layer, an underlying layer, and a recording layer. The grain diameter control layer is formed from an Ag film or a W film, to be a dispersed film or a continuous film on the seed layer. The grain diameter control layer acts as growing nuclei of the underlying layer formed thereon, and controls crystal grain diameters of the underlying layer. Especially, when the grain diameter control layer is deposited to be a dispersed layer, the underlying layer grows on the seed layer and the grain diameter control layer, and due to influence of the surface of the seed layer, the crystalline property of the underlying layer is improved.


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