The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2009

Filed:

Sep. 05, 2006
Applicant:

Rong-liang Chiou, Hsinchu, TW;

Inventor:

Rong-Liang Chiou, Hsinchu, TW;

Assignee:

Mediatek Inc., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for determining a puncture position for a de-puncturing process. A stream of received symbols that corresponds to a code is received. A slicing unit slices the stream of received symbols to determine representative bits of the code to form a first bit stream. A delay line delays the first bit stream to generate a second bit stream. A convolutional decoder de-punctures and decodes the received symbol to generate a third bit stream. A puncture decision unit, coupled to the delay line and the convolutional decoder, selects the puncture position with one of possible puncture positions, and delivers the puncture position signal indicating the puncture position, and compares the second bit stream and the third bit stream to generate an error metric corresponding to the puncture position, and determines one of the possible puncture positions according to the error metric as a detected puncture position.


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