The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2009
Filed:
Aug. 01, 2005
Ichiro Kikuchi, Yokohama, JP;
Siu-hung Fred AU, Fremont, CA (US);
Gregory Burd, San Jose, CA (US);
Zining Wu, Los Altos, CA (US);
Jun Xu, Sunnyvale, CA (US);
Tony Yoon, San Jose, CA (US);
Ichiro Kikuchi, Yokohama, JP;
Siu-Hung Fred Au, Fremont, CA (US);
Gregory Burd, San Jose, CA (US);
Zining Wu, Los Altos, CA (US);
Jun Xu, Sunnyvale, CA (US);
Tony Yoon, San Jose, CA (US);
Marvell International Ltd., Hamilton, BM;
Abstract
Systems and methods are provided for implementing error identification and evaluation for a Reed-Solomon (RS) error-correction code (ECC) system. The BMA algorithm and/or list decoding may produce one or more error locator polynomials that are related to a decision-codeword. An accelerated Chien search can be used to more quickly evaluate the one or more error locator polynomial. If the accelerated Chien search identifies a valid error locator polynomial, a normal Chien search can be used to identify error locations, and Forney's algorithm or an equivalent technique can be used to evaluate the error values. A RS ECC decoder can include a computation circuit that evaluates an error locator polynomial or an error evaluator polynomial. The computation circuit can include computation components that receive the coefficients of the polynomials.