The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2009

Filed:

Aug. 13, 2003
Applicants:

Henry Verschell, San Francisco, CA (US);

Raghuram Venkatasubramanian, Union City, CA (US);

Steve Cave, Gloucester, GB;

Martin Roth, Ashland, MA (US);

Inventors:

Henry Verschell, San Francisco, CA (US);

Raghuram Venkatasubramanian, Union City, CA (US);

Steve Cave, Gloucester, GB;

Martin Roth, Ashland, MA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for analyzing data from a database using an analytic database function includes receiving a selection of measured items from a user, receiving a placement item from the user, and determining a partitioning of the selection of measured items from the placement item. A placement item can be a column, a row, or an axis. A template associated with the analytic database function is adapted to define at least one partitioning relative to the placement item. The template is further adapted to define an ordering parameter for the analytic database function and optionally an aggregation level for the analytic database function. A database query is created with the partitioning. The database query can be an SQL statement.


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