The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2009

Filed:

Jul. 27, 2007
Applicants:

Mark Gregory Meyer, Denton, MD (US);

Darrell Bruce Mcindoe, Brookeville, MD (US);

Inventors:

Mark Gregory Meyer, Denton, MD (US);

Darrell Bruce McIndoe, Brookeville, MD (US);

Assignee:

iJET International, Inc., Annapolis, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 99/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for risk assessment are disclosed. In various embodiments, the systems and methods may include at least one risk information source receiving risk information, and generating a risk assessment report based on the risk information. In various embodiments, the systems and methods may include a risk information source, an asset information source, and an analysis system that correlates one or more risks with one or more assets. In various embodiments, the systems and methods may generate a risk assessment report from the correlated risk information and asset information. In various embodiments, the systems and methods may be applied globally assessing risks that occur in any region or country throughout the world, for any type of risk(s) or any type of asset(s). In various embodiments, the systems and methods may be beneficial to business organizations for identifying, quantifying and/or managing potential and/or actual operating risks.


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