The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2009

Filed:

Apr. 07, 2004
Applicants:

Kenneth Kai-baun MA, Sammamish, WA (US);

Stephen Craig Schertz, Issaquah, WA (US);

Inventors:

Kenneth Kai-Baun Ma, Sammamish, WA (US);

Stephen Craig Schertz, Issaquah, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system is provided for instrumenting a program by optimizing probe insertion. The number of probe insertions into instrumented code is reduced by providing optimal probe insertion points. The control flow of the code is analyzed along with the arc and block relationships to build a post-dominator tree. An optimization map is generated from the post-dominator tree that provides the optimal probe insertion points. Once the probes are inserted and data is collected by running the binary representing the code and probes, the data may be overlaid onto the optimization map and arc and block relationships to provide code coverage data.


Find Patent Forward Citations

Loading…