The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2009
Filed:
Jan. 30, 2006
Applicants:
Guofei Jiang, Princeton, NJ (US);
Haifeng Chen, Piscataway, NJ (US);
Cristian Ungureanu, Princeton, NJ (US);
Kenji Yoshihira, Cranford, NJ (US);
Inventors:
Guofei Jiang, Princeton, NJ (US);
Haifeng Chen, Piscataway, NJ (US);
Cristian Ungureanu, Princeton, NJ (US);
Kenji Yoshihira, Cranford, NJ (US);
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system that automatically derives models between monitored quantities under non-faulty conditions so that subsequent faults can be detected as deviations from the derived models. The invention identifies unusual conditions for fault detection and isolation that is absent in rule-based systems.