The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2009

Filed:

Jul. 02, 2007
Applicant:

Andrew J. Hull, Portsmouth, RI (US);

Inventor:

Andrew J. Hull, Portsmouth, RI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for calculating material properties of a material includes determining a dilatational wavespeed and a shear wave speed. The dilatational wavespeed is determined by conducting vertical vibration tests of two specimens of the material, one specimen being twice as thick as the other. Transfer functions are obtained from these tests and used to calculate the dilatational wavespeed. The shear wavespeed is determined by conducting horizontal vibration tests of two specimens with one specimen being twice as thick as the other. The shear wavespeed can be calculated from transfer functions obtained from these tests and the dilatational wavespeed. Other material properties can be calculated from the dilatational and shear wavespeeds. Frequency dependence of the properties can be determined by conducting the tests at different frequencies.


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