The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2009

Filed:

Nov. 26, 2003
Applicants:

Rakesh Mohan Lal, Waukesha, WI (US);

David C. Mack, Waukesha, WI (US);

Gopal B. Avinash, New Berlin, WI (US);

Inventors:

Rakesh Mohan Lal, Waukesha, WI (US);

David C. Mack, Waukesha, WI (US);

Gopal B. Avinash, New Berlin, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique is provided for improving digital images by analysis of the sampling rate of the image data. The optimal sampling rate is determined, such as based on the point-spread function of the imaging system, and is compared to the actual pixel sampling rate. Based upon the comparison, the image may be shrunk or sub-sampled to provide the optimal sampling rate that allows for optimal image filtering while accounting for inherent variations in spatial resolution of the images.


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