The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2009
Filed:
Dec. 22, 2006
Ryuichi Tohma, Akashi, JP;
Tokihiro Kosaka, Kakogawa, JP;
Ryuichi Tohma, Akashi, JP;
Tokihiro Kosaka, Kakogawa, JP;
Sysmex Corporation, Kobe-shi, JP;
Abstract
A specimen imaging apparatus is provided that is capable of improved high-speed operation compared to conventional apparatuses. The specimen imaging apparatus is provided with a microscope for enlarging the image of a specimen, and taking the enlarged image of the specimen obtained by the microscope. The apparatus is provided with a vibration detector for detecting a relative vibration between the objective lens of the microscope and the specimen mounted in the microscope, a focuser for focusing before the vibration detected by the vibration detector has attenuated to less than a predetermined value, and a controller for determining whether or not a vibration detected by the vibration detector is less than a predetermined value. The specimen imaging apparatus is configured so as to take the enlarged image of a specimen when the controller has determined that the vibration is less than a predetermined value.