The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2009
Filed:
Sep. 28, 2007
Karin Kuroiwa, Kanagawa-ken, JP;
Karin Kuroiwa, Kanagawa-ken, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An optical tomograph obtains tomographic images by administering frequency analysis on an interference light beam formed by interference between a reflected light beam, which is a measuring light beam reflected by a measurement target, and a reference light beam. A tomographic data obtaining section obtains tomographic data to be used for optical path length adjustment each time that the position, onto which the measuring light beam is irradiated, is changed. An optical path length adjusting section adjusts the optical path length of one of the measuring light beam, the reflected light beam, and the reference light beam, based on the obtained tomographic data.