The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2009
Filed:
Mar. 29, 2005
Yoshihiro Kawano, Hachioji, JP;
Keiji Shimizu, Fussa, JP;
Minoru Sukekawa, Hachioji, JP;
Tsuyoshi Mochizuki, Hino, JP;
Susumu Honda, Hachioji, JP;
Kazuhiro Hayashi, Akishima, JP;
Yoshihiro Kawano, Hachioji, JP;
Keiji Shimizu, Fussa, JP;
Minoru Sukekawa, Hachioji, JP;
Tsuyoshi Mochizuki, Hino, JP;
Susumu Honda, Hachioji, JP;
Kazuhiro Hayashi, Akishima, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A microscope examination apparatus is provided that includes a light source for emitting excitation light or illumination light to a specimen placed on a stage; an objective lens opposing the stage and capable of focusing fluorescence or reflected light from the specimen; an image-forming lens for forming an image of the specimen obtained by the objective lens; and an image-capturing unit for capturing the image of the specimen forming by the image-forming lens, wherein a plurality of the objective lenses having different magnifying powers is provided, and an objective-lens switching mechanism for switching among the objective lenses is provided, and wherein a plurality of the image-forming lenses having different magnifying powers is provided, and an image-forming-lens switching mechanism for switching among the image-forming lenses is provided.