The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2009
Filed:
Sep. 02, 2008
Kun-i Yuan, Taipei Hsien, TW;
Kun-I Yuan, Taipei Hsien, TW;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
A method for testing and positioning a lens includes determining whether a modulation transfer function (MTF) value of the lens for an object at a first object distance is not less than a first required MTF value and whether another MTF value of the lens for an object at a secondary object distance is not less than a secondary required MTF value. A first MTF curve is plotted according to optical resolution measurements for the object at the first object distance, and the secondary MTF curve is obtained by offsetting the first MTF curve. The secondary MTF curve can approximately represent optical resolution measurements for the object at a secondary object distance. The method can determine an ideal range of positions of the lens relative to an image sensor.