The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7589540 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 15, 2009

Filed:

Jan. 31, 2007
Applicants:

Jan-jin Nam, Yongin-si, KR;

Yong-weon Jeon, Suwon-si, KR;

Inventors:

Jan-Jin Nam, Yongin-si, KR;

Yong-Weon Jeon, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); H04L 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a current-mode semiconductor integrated circuit device that operates in a voltage mode during a test mode. The current-mode semiconductor integrated circuit device includes a first transmitting converter, a first receiving converter, a second transmitting converter, and a second receiving converter. During the test mode, one of a first signal path and a second signal path is selected according to the location of the chip. In the first signal path, the first transmitting converter, the first receiving converter, and the second transmitting converter operate. In the second signal path, the second transmitting converter, the second receiving converter, and the first transmitting converter operate. Each of the first and second transmitting converters receives a test voltage signal and converts it into a current signal. Each of the first and second receiving converters generates a reference voltage signal, compares it with the test voltage signal, and outputs the comparing result.


Find Patent Forward Citations

Nam, Jan-Jin. (2009). Current-mode semiconductor integrated circuit device operating in voltage mode during test mode (U.S. Patent No. 7589540). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7589540

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