The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2009

Filed:

Jul. 31, 2006
Applicants:

Behnam Bastani, San Diego, CA (US);

Jorge Miguel Gomez, San Diego, CA (US);

Inventors:

Behnam Bastani, San Diego, CA (US);

Jorge Miguel Gomez, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 25/308 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for detecting pen-to-paper spacing (PPS) in a printing system having a pen attached to a moveable print head positioned near a print media position, includes a test pattern, at the print media position, a sensor device, attached to the print head, and a controller. The test pattern includes printed lines having a line dimension, and the sensor device is positioned to shine light upon, and detect light reflected from the test pattern as the print head scans across the test pattern. The controller is connected to receive reflectance signals from the reflectance sensor, and configured to determine line dimensions in the test pattern and compare said line dimensions with predetermined line dimension values for the test pattern to determine variation in the PPS.


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