The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2009

Filed:

Mar. 20, 2006
Applicants:

Robert S. Lynch, Old Mystic, CT (US);

Peter K. Willett, Coventry, CT (US);

Inventors:

Robert S. Lynch, Old Mystic, CT (US);

Peter K. Willett, Coventry, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention is a method of training a mean-field Bayesian data reduction algorithm (BDRA) based classifier which includes using an initial training for determining the best number of levels. The Mean-Field BDRA is then retrained for each point in a target data set and training errors are calculated for each training operation. Cluster candidates are identified as those with multiple points having a common training error. Utilizing these cluster candidates and previously identified clusters as the identified target data, the clusters can be confirmed by comparing a newly calculated training error with the previously calculated common training error for the cluster. The method can be repeated until all cluster candidates are identified and tested.


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