The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2009
Filed:
Aug. 26, 2005
Applicant:
Tatsuo Fujikura, Kanagawa-ken, JP;
Inventor:
Tatsuo Fujikura, Kanagawa-ken, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract
A measuring unit for use in a sensor utilizing the phenomenon of attenuation in total internal reflection includes a dielectric block which is transparent to a light beam and has a flat and smooth surface on which a film layer is formed, and a flow passage member held in close contact with the film layer. The flow passage member is provided with a passage comprising a supply passage extending from an inlet of the flow passage member to a measuring portion and a discharge passage extending from the measuring portion to an outlet of the flow passage member.