The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2009

Filed:

May. 21, 2004
Applicant:

Yasushi Nagasawa, Ymanashi-ken, JP;

Inventor:

Yasushi Nagasawa, Ymanashi-ken, JP;

Assignee:

Terumo Kabushiki Kaisha, Shibuya-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

A component measuring device for measuring the quantity and/or the property of a given component in a specimen by calorimetrically measuring a test strip includes a tip mount on which is to be mounted a tip having the test strip, and a photometric unit. The photometric unit comprises a light-emitting element that applies light to the test strip while the tip is mounted on the tip mount, a light-detecting element that detects light reflected from the test strip, and a holder in which is held the light-emitting element and the light-detecting element. The holder possesses a passage through which passes the light and the reflected light. A light-transmissive member closes the passage with a sealing member interposed therebetween in a portion of the holder which faces the test strip. The component measuring device can also be provided with a stain detecting device which is adapted to detect a stain on the light-transmissive member.


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