The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2009
Filed:
Mar. 28, 2007
Applicants:
Lawrence C. Gunn, Iii, Encinitas, CA (US);
Roman Malendevich, Sunnyvale, CA (US);
Thierry J. Pinguet, Cardiff by the Sea, CA (US);
Maxime Jean Rattier, Paris, FR;
Myles Sussman, San Mateo, CA (US);
Jeremy Witzens, Del Mar, CA (US);
Inventors:
Lawrence C. Gunn, III, Encinitas, CA (US);
Roman Malendevich, Sunnyvale, CA (US);
Thierry J. Pinguet, Cardiff by the Sea, CA (US);
Maxime Jean Rattier, Paris, FR;
Myles Sussman, San Mateo, CA (US);
Jeremy Witzens, Del Mar, CA (US);
Assignee:
Luxtera, Inc., Carlsbad, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01N 21/00 (2006.01); G01N 21/55 (2006.01); G06K 9/00 (2006.01); H01L 21/00 (2006.01); G01R 31/26 (2006.01); H01L 21/66 (2006.01); G01N 21/86 (2006.01); G01V 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light from top of the wafer.