The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2009
Filed:
Apr. 05, 2006
Tsutomu Inoue, Hachioji, JP;
Fuminori Sato, Hachioji, JP;
Yoshihito Narita, Hachioji, JP;
Mutsumi Senuma, Hachioji, JP;
Tsutomu Inoue, Hachioji, JP;
Fuminori Sato, Hachioji, JP;
Yoshihito Narita, Hachioji, JP;
Mutsumi Senuma, Hachioji, JP;
JASCO Corporation, Hachioji-shi, Tokyo, JP;
Abstract
A near-field polarized-light measurement apparatuscomprises a near-field probe, an analyzer, a detector, and an analyzer-rotating unit. The near-field probehas at a tip thereof an opening smaller than the wavelength of light used for measurement and generates linearly polarized near-field light from the opening and irradiates a sample with the near-field light. The detectordetects light transmitted through the sample via the analyzer. The analyzer-rotating unitrotates the analyzerabout an optical axis to vary the angle of a transmission axis thereof. And optical rotation of the sample is measured by rotating the analyzerwith the analyzer-rotating unit