The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2009

Filed:

May. 26, 2006
Applicants:

Damian Edward Haydon Baskeyfield, Auldeam, GB;

Thomas J. O'reilly, Invemess, GB;

John Mcinulty, Westhill, GB;

Grenville Arthur Robinson, Rosemarkie, GB;

Anthony J. Cronshaw, Cambridge, GB;

Inventors:

Damian Edward Haydon Baskeyfield, Auldeam, GB;

Thomas J. O'Reilly, Invemess, GB;

John McInulty, Westhill, GB;

Grenville Arthur Robinson, Rosemarkie, GB;

Anthony J. Cronshaw, Cambridge, GB;

Assignee:

Lifescan, Scotland, Ltd., Inverness, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A calibration strip for use with a package of test strips includes a substrate with and a permutative grey scale calibration pattern disposed on a surface of the substrate with the permutative grey scale calibration pattern including more than one grey scale region. Moreover, the grey scale regions of the calibration strip define a grey scale permutation that uniquely corresponds to a calibration code of test strips in a package associated with the calibration strip.


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