The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2009
Filed:
Nov. 01, 2007
Shin-hui Chen, Taipei Hsien, TW;
Chien-hung Lo, Taipei Hsien, TW;
Xiang Cao, Shenzhen, CN;
Zheng-quan Peng, Shenzhen, CN;
Shin-Hui Chen, Taipei Hsien, TW;
Chien-Hung Lo, Taipei Hsien, TW;
Xiang Cao, Shenzhen, CN;
Zheng-Quan Peng, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
A power cycle test method for testing an electronic equipment () includes: configuring a total test count and a current test count; updating the current test count by incrementing the current test count by a value; utilizing a corresponding AC control signal, a corresponding DC control signal, and a reboot control signal to control the electronic equipment in sequence; checking whether the electronic equipment is in a workable condition when the electronic equipment is respectively controlled under the control signals; repeating the updating step, the utilizing step and the checking step until the current test count is equal to the total test count; and generating a result message if the current test count is equal to the total test count. A related system is also disclosed.