The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2009
Filed:
Mar. 15, 2004
Katsutoshi Takahashi, Tokyo, JP;
Kazuhiro Iida, Tokyo, JP;
Masakazu Baba, Tokyo, JP;
Noriyuki Iguchi, Tokyo, JP;
Toru Sano, Tokyo, JP;
Hisao Kawaura, Tokyo, JP;
Toshitsugu Sakamoto, Tokyo, JP;
Wataru Hattori, Tokyo, JP;
Hiroko Someya, Tokyo, JP;
Katsutoshi Takahashi, Tokyo, JP;
Kazuhiro Iida, Tokyo, JP;
Masakazu Baba, Tokyo, JP;
Noriyuki Iguchi, Tokyo, JP;
Toru Sano, Tokyo, JP;
Hisao Kawaura, Tokyo, JP;
Toshitsugu Sakamoto, Tokyo, JP;
Wataru Hattori, Tokyo, JP;
Hiroko Someya, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
After a sample is previously separated into plural components in a channel formed in a microchip (), the channel is irradiated along a separation direction with a laser beam from a laser oscillator () to sequentially ionize each fraction separated in the channel. The ionized fraction is detected by a mass spectrometry unit () and analyzed by an analytical result analyzing unit (). The analytical result is stored in a memory () while associated with position information in a driver control unit () and information on laser beam irradiation condition in a laser control unit (), and the analytical result is imaged by an imaging unit (). The imaged analytical result is displayed on a display ().