The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2009

Filed:

Mar. 01, 2004
Applicants:

Mary Morabito O'neill, Santa Barbara, CA (US);

Gregory K. Pierce, Santa Barbara, CA (US);

William H. Wellman, Santa Barbara, CA (US);

Inventors:

Mary Morabito O'Neill, Santa Barbara, CA (US);

Gregory K. Pierce, Santa Barbara, CA (US);

William H. Wellman, Santa Barbara, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A position of a feature in a scene is located by forming an image of the feature using a segmented array having a plurality of array subelements. Each of the array subelements has an output signal. The output signals from at least two spatially adjacent array subelements are cooperatively analyzed to establish a data set reflective of an extent to which output signals responsive to the image of the feature are produced from exactly one or from more than one of the adjacent array subelements. The data set is used to reach a conclusion as to a location of the image of the feature on the segmented array. Increased positional accuracy is attained with no loss of sensitivity.


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