The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2009

Filed:

Jul. 16, 2007
Applicants:

Matti Innala, Järvenpää, FI;

Tatu Pitkänen, Järvenpää, FI;

Petteri Lannes, Jokela, FI;

Topi Tynkkynen, Vantaa, FI;

Petri Päivä, Järvenpää, FI;

Marko Tiilikainen, Kellokoski, FI;

Inventors:

Matti Innala, Järvenpää, FI;

Tatu Pitkänen, Järvenpää, FI;

Petteri Lannes, Jokela, FI;

Topi Tynkkynen, Vantaa, FI;

Petri Päivä, Järvenpää, FI;

Marko Tiilikainen, Kellokoski, FI;

Assignee:

Metso Paper, Inc., Helsinki, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring a nip pressure and/or a pressure profile is provided, wherein a nip-forming roll is fitted with a pressure sensor under a coating layer which is protective and functions as a spring on top of the sensor, and the nip pressure delivers to the bottom surface of the coating a deformation proportional to the nip pressure and the deformation compresses the sensor, which responds to the deformation by generating an electric signal.


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