The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2009

Filed:

Jan. 10, 2008
Applicants:

Mike M. Ghiran, Lake Orion, MI (US);

Spyros P. Mellas, Waterford, MI (US);

William M. Crantas, Highland, MI (US);

Kevin R. Marks, Durand, MI (US);

David R. Friddell, Grand Blanc, MI (US);

Paul D. Larsen, Fenton, MI (US);

Inventors:

Mike M. Ghiran, Lake Orion, MI (US);

Spyros P. Mellas, Waterford, MI (US);

William M. Crantas, Highland, MI (US);

Kevin R. Marks, Durand, MI (US);

David R. Friddell, Grand Blanc, MI (US);

Paul D. Larsen, Fenton, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21D 7/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of bending a metal object, such as a tube, is provided that uses real time, closed-loop feedback of the actual springback of the object in order to modify the applied bending force or preprogrammed bending coordinates so that the final desired bend geometry is achieved. The variability of springback from object to object is thus accounted for and the number of objects that must be scrapped due to incorrect bends (over bend or under bend) is reduced. The method is carried out using an apparatus such as a rotary draw bender with a measuring device operable to measure actual bend coordinates of metal objects bent by the bender. A controller is operatively connected to the bender and the measuring device and is configured to control the bender to bend the metal objects at least partly based on measured bend coordinates provided by the measuring device.


Find Patent Forward Citations

Loading…