The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Sep. 14, 2006
Applicants:
Michael Altenhofen, Karlsruhe, DE;
Thomas Hettel, Brisbane, AU;
Inventors:
Michael Altenhofen, Karlsruhe, DE;
Thomas Hettel, Brisbane, AU;
Assignee:
SAP AG, Walldorf, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method to analyze impact of changes to a model includes accessing a proposed change to a model. An expression that is relevant to the proposed change is accessed. An instances set associated the expression is obtained. The instance set is evaluated to determine an impact of the proposed change to the model. An application utilizes the expression of a model. An impact analyzer assesses impact of a change to the model by evaluating at least one of the one or more expressions and returning an evaluation set for use by the application.