The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Jul. 10, 2007
Hyeung-yun Kim, Palo Alto, CA (US);
Hyeung-Yun Kim, Palo Alto, CA (US);
Advanced Structure Monitoring, Inc., Cupertino, CA (US);
Abstract
Systems, methods and recordable media for generating tomographic images to monitor structural health conditions. A method includes the steps of obtaining a plurality of damage index values for a network that is coupled to a host structure and has a plurality of diagnostic network patches (DNP), generating a distribution of damage index value over a surface using the obtained damage index values, and formatting the distribution as at least one tomographic image. Each of the patches is able to operate as at least one of a transmitter patch and a sensor patch. The damage index values is a quantity to be affected by damage in the host structure or associated with signals generated by the patches in a response to an impact on the host structure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile