The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Jul. 07, 2005
Yasuhiro Kotani, Kanagawa-ken, JP;
Hiroaki Suzuki, Kanagawa-ken, JP;
Makoto Takase, Kanagawa-ken, JP;
Yasuhiro Kotani, Kanagawa-ken, JP;
Hiroaki Suzuki, Kanagawa-ken, JP;
Makoto Takase, Kanagawa-ken, JP;
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
Embodiments of the invention provide a method of testing/adjusting magnetic disk devices, in which the method allows the tests/adjustments to be conducted by solving problems due to the data sizes and characteristics of test/adjustment programs. After assembly of a magnetic disk device, setup of various parameters, magnetic disk defect registration, and other test/adjustment steps are executed. Execution of the test/adjustment programs does not require a special test apparatus since they are executed in the magnetic disk device to be tested. In addition, the test/adjustment programs are formed up of multiple phases, and each phase is sequentially executed. Adoption of this program structure keeps the tests/adjustments clear from restrictions due to the data sizes and characteristics of the test/adjustment programs.