The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2009

Filed:

Jun. 27, 2007
Applicant:

Andrew J. Hull, Portsmouth, RI (US);

Inventor:

Andrew J. Hull, Portsmouth, RI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for calculating material properties of a material includes conducting two insertion loss tests of the material having a single thickness and a double thickness. These tests are conducted at a zero wavenumber. Utilizing these insertion loss tests, a dilatational wavespeed is computed. The method continues by calculating a shear wavespeed by performing three insertion loss tests of the material at single, double and triple thicknesses. These tests are conducted at a non-zero wavenumber. A shear wavespeed can be calculated from the dilatational wavespeed and these insertion loss tests. Lamé constants, Young's modulus, Poisson's ratio, and the shear modulus for the material of interest can then be calculated using the dilatational and shear wavespeeds.


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