The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2009

Filed:

Jan. 27, 2006
Applicants:

Michael G. Mcintyre, Austin, TX (US);

Alex Bierwag, Austin, TX (US);

Charlie Reading, Austin, TX (US);

Alfredo V. Herrera, Austin, TX (US);

Inventors:

Michael G. McIntyre, Austin, TX (US);

Alex Bierwag, Austin, TX (US);

Charlie Reading, Austin, TX (US);

Alfredo V. Herrera, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G01N 21/00 (2006.01); G01R 31/02 (2006.01); G06F 19/00 (2006.01); G06F 11/30 (2006.01); G21C 17/00 (2006.01); G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus, and a system for generating an index for storing data. A pattern associated with a first set of data is determined. The first set of data is stored. A determination is made as to whether the pattern associated with a second set of data corresponds to the pattern associated with the first set of data. An index associated with the first set of data is correlated to the second set of data in response to determining that the pattern associated with the second set of data corresponds to the pattern associated with the first set of data.


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