The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2009

Filed:

Nov. 24, 2004
Applicants:

J. Eric Tkaczyk, Delanson, NY (US);

Deborah Walter, Burnt Hills, NY (US);

Yanfeng Du, Rexford, NY (US);

Inventors:

J. Eric Tkaczyk, Delanson, NY (US);

Deborah Walter, Burnt Hills, NY (US);

Yanfeng Du, Rexford, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method are disclosed for reconstructing contrast-enhanced CT images that are substantially free of beam-hardening artifacts. An imaging system includes a radiation source configured to project radiation toward an object to be scanned and an energy discriminating detector assembly having a plurality of detector elements and configured to detect radiation emitted by the radiation source and attenuated by the object to be scanned. The imaging system also includes computer programmed to count a number of photons detected by each detector element and associate an energy value to each counted photon and determine a material composition of a CT view from the number of photons counted and the energy value associated with each counted photon. The computer is also programmed to apply a weighting to the CT view based on the material composition of the CT view and reconstruct an image with differential weighting based on the weighting of the CT view.


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