The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2009

Filed:

Jul. 02, 2004
Applicants:

Marcos Dantus, Okemos, MI (US);

Vadim V Lozovoy, Okemos, MI (US);

Matthew Comstock, Milford, OH (US);

Inventors:

Marcos Dantus, Okemos, MI (US);

Vadim V Lozovoy, Okemos, MI (US);

Matthew Comstock, Milford, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/10 (2006.01); G01N 33/50 (2006.01); G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A laser and monitoring system is provided. In another aspect of the present invention, the system includes a laser, pulse shaper and detection device. A further aspect of the present invention employs a femtosecond laser and binary pulse shaping (BPS). Still another aspect of the present invention uses a laser beam pulse, a pulse shaper and a SHG crystal. In yet another aspect of the present invention, a multiphoton intrapulse interference phase scan (hereinafter 'MIIPS') method is used to characterize the spectral phase of femtosecond laser pulses and to correct them. A further aspect of the system of the present invention is employed to monitor environmental chemicals and biological agents, including toxins, explosives, and diseases.


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