The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Sep. 08, 2005
Masaki Kudoh, Tokyo, JP;
Toshiaki Satoh, Kanagawa, JP;
Masaki Kudoh, Tokyo, JP;
Toshiaki Satoh, Kanagawa, JP;
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
Embodiments of the present invention provide a defect registration method for performing defect registration of sectors on a magnetic disk. In one embodiment, a rectangular detection window is applied to each defect sector. A threshold value of the detection window is set at 2. In addition, an additional sector group is defined for the detection window. The additional sector group is a target of the defect registration if the number of defect sectors exceeds the threshold value. The additional sector group covers sectors that are not judged as defects in defect detection inspection, but that are expected to be potentially defective. Even if the detection window is applied to a defect sector, an additional sector group is not generated. However, if the detection window is applied to a defect sector, an additional sector group is generated. If the detection window is applied to a defect pattern, an additional sector group is generated.