The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Oct. 27, 2003
Applicant:
Reiner Rygiel, Altrip, DE;
Inventor:
Reiner Rygiel, Altrip, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01); G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
Abstract
A sample carrier () for microscopy, in particular for confocal microscopy, and a method for producing the sample carrier (), are disclosed. The sample carrier () has a first coverslip () and a second coverslip (). The second coverslip () carries an mirror () which is equipped in such a way that it surrounds a sample region (). Also provided is a frame () that retains the first and the second coverslip (and). The coverslips located in the frame () form a cavity (), that cavity () being filled with a medium which has approximately the same refractive index as the first and the second coverslip (and).