The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Mar. 29, 2005
Takakazu Yano, Tokyo, JP;
Kenji Matsumoto, Tokyo, JP;
Tadahiro Fukuda, Tokyo, JP;
Miharu Sugiura, Tokorozawa, JP;
Takakazu Yano, Tokyo, JP;
Kenji Matsumoto, Tokyo, JP;
Tadahiro Fukuda, Tokyo, JP;
Miharu Sugiura, Tokorozawa, JP;
Citizen Holdings Co., Ltd., Tokyo, JP;
Abstract
An object of the present invention is to provide an optical measurement apparatus equipped with an ion-exchange resin for pretreating a sample, thereby enabling the concentration of component in the sample to be measured with higher accuracy. The optical measurement apparatus of the present invention includes, in addition to the ion-exchange resin, an optical measurement section for measuring, based on the optical characteristics of the component, the concentration of the component in the sample after the sample is passed through the ion-exchange resin.