The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Mar. 30, 2007
Applicants:
Jeffrey A. Simpson, Wayne, NE (US);
Mark A. Imbrock, Sylvania, OH (US);
Nathan Strimpel, Carleton, MI (US);
Inventors:
Jeffrey A. Simpson, Wayne, NE (US);
Mark A. Imbrock, Sylvania, OH (US);
Nathan Strimpel, Carleton, MI (US);
Assignee:
Electronic Design To Market, Inc., Toledo, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A detection system for measuring glass that has been placed under strain and the resulting stress lines in the glass has a light source of individual elements configured to create a light distribution. The light distribution has a discontinuity which enhances the viewing of a photoelastic effect in the glass. The light source creates a viewable optical interference (i.e., color changes) which results from stress lines in the glass.