The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Oct. 09, 2007
Juergen Detlefsen, Berg, DE;
Michael Jeck, Mainz, DE;
Juergen Detlefsen, Berg, DE;
Michael Jeck, Mainz, DE;
Smiths Heimann GmbH, Wiesbaden, DE;
Abstract
A method for imaging test objects by millimeter waves, especially for checking individuals for suspicious objects is provided, whereby the test object is gradually irradiated with millimeter waves along its circumference and the scattered waves are received and evaluated in order to display an image of the test object. A viewing direction of the transmitting area and a direction of reception of the receiving area extend at an angle of 15° to 70°, preferably 20° to 35° to the longitudinal axis of the test object. For evaluation of the scattered waves in the direction of the longitudinal axis of the test object, a pulse radar or FMCW radar technology is used, and for evaluation at an angle to the longitudinal axis, SAR technology is used.