The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2009

Filed:

Oct. 26, 2007
Applicants:

Stephan Schmitt, Munich, DE;

Juergen Zimmer, Ottobrunn, DE;

Inventors:

Stephan Schmitt, Munich, DE;

Juergen Zimmer, Ottobrunn, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sensor includes a substrate having a mechanically deformable region that is deformable in a direction non-parallel to a surface of the substrate, and a magnetostrictive multi-layer sensor element configured to detect a mechanical deformation of the mechanically deformable region in a direction that is non-parallel to the substrate surface. The multi-layer sensor element includes a sensor layer having a material having a positive or a negative magnetostriction constant. The sensor further includes a device, arranged on the substrate, that is configured to generate a controllable magnetic field by which a performance of the magnetostrictive multi-layer sensor element is influenced, wherein the magnetostrictive multi-layer sensor element exhibits an electrical resistance that is a function of the controllable magnetic field and a deformation of the mechanically deformable region.


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