The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2009

Filed:

Sep. 26, 2007
Applicants:

Jae Yong Lee, Chungbuk, KR;

Eun Seong Lee, Daejeon, KR;

Inventors:

Jae Yong Lee, Chungbuk, KR;

Eun Seong Lee, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is an imaging apparatus for IR four-wave mixing polarization microscopy. The apparatus can include pump and probe beam sources, a polarizer, a beam combiner, a scanner, an optical focusing system, a collecting optical system, a dichroic beam splitter, a polarizing beam splitter, a photodetector, a polarization differential detector, and a data analyzer. The technology can be used to obtain a molecular vibrational microscopic image using a polarization-dependent nonlinear spectroscopic signal obtained through the focusing and spatial scanning of multi-wavelength laser beams in a sample.


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