The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Dec. 21, 2006
Anatoli N. Verentchikov, St. Petersburg, RU;
Anatoli N. Verentchikov, St. Petersburg, RU;
Leco Corporation, St. Joseph, MI (US);
Abstract
An imbalanced radio frequency (RF) field creates a retarding barrier near the exit aperture of a multipole ion guide, in combination with the extracting DC field such that the barrier provides an m/z dependent cut of ion sampling. Contrary to the prior art, the mass dependent sampling provides a well-conditioned ion beam suitable for other mass spectrometric devices. The mass selective sampling is suggested for improving duty cycle of o-TOF MS, for injecting ions into a multi-reflecting TOF MS in a zoom mode, for parallel MS-MS analysis in a trap-TOF MS, as well as for moderate mass filtering in fragmentation cells and ion reactors. With the aid of resonant excitation, the mass selective ion sampling is suggested for mass analysis.