The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Nov. 12, 2004
Applicant:
Hiroshi Fuji, Soraku-gun, JP;
Inventor:
Hiroshi Fuji, Soraku-gun, JP;
Assignee:
Sharp Kabuhsiki Kaisha, Osaka, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A sample detection device includes a disk substrate which allows a light beam to be transmitted, and the substrate has flow paths each of which allows polymers to be injected therein, wherein the substrate further includes a guiding groove, provided in a perpendicular direction with respect to a longitudinal direction of each flow path, along which the light beam for detecting polymers scans. According to the sample detection device, it is possible to efficiently detect many kinds of polymers in accordance with respective separation rates of the polymers.