The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Jul. 19, 2004
Albrecht Maurer, Seligenstadt, DE;
Michael Strauss, Moembris, DE;
Walter DE Odorico, Kelkheim, DE;
Roman Koch, Blankenbach, DE;
Albrecht Maurer, Seligenstadt, DE;
Michael Strauss, Moembris, DE;
Walter De Odorico, Kelkheim, DE;
Roman Koch, Blankenbach, DE;
GE Inspection Technologies GmbH, Alzenau, DE;
Abstract
A method and circuit arrangement for processing signals which are produced during disturbance-free examination of objects such as pipes or sheet metal, by reflecting ultrasonic waves at defective spots on the structure of the object. According to the method, a complete wave front is emitted on at least one section of the object which is to be examined by means of a plurality of independent transmitting elements, a wave reflected by the structure of the object is received by means of a plurality of receiving elements which are independent of each other, the signals received by the receiving elements are digitalized, and the digitalized signals are stored in a storage element according to amplitude and propagation time. In order to detect defective points on the structure of the object in a faster manner with improved signal/noise ratio, the defective points are detected by a phase-locked addition of the stored amplitude values of the propagation time.